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Homepage of John Ting-Yung Wen
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John T. Wen

Professor, Department of Electrical, Computer, and Systems Eng.  (joint appointment in Mechanical, Aerospace, and Nuclear Eng.)
Director, Center for Automation Technologies and Systems (CATS)

Rensselaer Polytechnic Institute

CII 8015,
110 8th St., Troy, NY 12180-3590
Voice: (518)-276-6156  Fax: (518)-276-4897 
Email: wenj at rpi dot edu

John Ting-Yung Wen received his B.Eng. from McGill University in 1979, M.S. from University of Illinois in 1981, and Ph.D. from Rensselaer Polytechnic Institute in 1985, all in Electrical Engineering.  From 1981-1982, he was a system engineer at Fisher Controls where he developed a plant-wide coordination control system for pulp and paper plants.  From 1985-1988, he was a member of technical staff at the Jet Propulsion Laboratory where he developed new modeling and control algorithms for large space structures and space robots.  Since 1988, he has been with Rensselaer Polytechnic Institute where he is currently a professor in the Department of Electrical, Computer, and Systems Engineering with a joint appointment in the Department of Mechanical, Aerospace, and Nuclear Engineering.  Since July 2005, he has been the Director of a New York State sponsored interdisciplinary center, Center for Automation Technologies and Systems (CATS).  He was the Interim Director of the Smart Lighting Center, an NSF Engineering Research Center involving six partner universities, from June 2009 to December 2009. Dr. Wen was an ASEE/NASA Summer Faculty Fellow in 1993, a Japan Society for the Promotion of Science (JSPS) Senior Visiting Scientist in 1997, and an Oversea Assessor of the Chinese Academy of Sciences, 2004-2009. Dr. Wen has over 200 technical publications in leading journals and conferences.  His research interest lies in the general area of dynamical systems modeling and control with applications to high performance motion systems, robot manipulation, opto-mechatronics systems, thermal management, and aerodynamic flow control.  Dr. Wen is a Fellow of IEEE.